Description
DESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8″) pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9). Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs Springloaded vise clamp with reversible jaws for an opening up to 38mm. The universal jaws have special slots to firmly hold round samples of various diameters both horizontally and vertically. Maximum width of the jaws is 32mm. Material: machined aluminum with stainless steel springs, rods, screws, washers, and brass sliders. Overall size of the vise clamp w/o pin is 67 x 52 x 20mm (2.64″ x 2″ x 0.8″). Screw used is 2-56 x 1/8, Set Cup, SS Universal Springloaded Vise with Reversible Clamps, Pin
