Description
DESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8″) pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9). Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs Springloaded vise clamp for samples up to 26mm. The jaws are 25mm (1″) wide. Jaws also accommodate 1/16″ x 1/2″ stainless steel pins for more awkward shaped samples. 4 pins are included. Removable pushrods for easy loading are provided. Material: machined aluminum with stainless steel pins and springs. Overall size of vise clamp w/o pin and push rods 50 x 25 x 15mm (2″ x 1″ x 5/8″). Technical Notes, Springloaded Vise Clamp (PDF 169KB) Screw used is 2-56 x 1/8, Set Cup, SS
