Description
DESCRIPTION PRODUCT SPECIFICATIONS Tapping mode probes for AFM-IR Type D – Unmounted A 10 pack of probes for tapping mode imaging and nanoIR spectroscopic measurements. Unmounted for use on Bruker’s IconIR system or others systems that can take a standard cantilever chip. This 300khz tapping mode probe has a full wrap gold coating, on the reflex side — for increased feedback laser signal, on the tip side — to enable nanoIR measurements. General Specifications Feature
Value Geometry
Rectangular Tip Radius (nm)
Nominal: 20.0, Max: 35.0 Frequency (kHz)
Nominal: 300, Min: 200, Max: 400 Length (µm)
Nominal: 125, Min: 115, Max: 135 Spring Constant (N/m)
Nominal: 40, Min: 20, Max: 80 Width (µm)
Nominal: 40, Min: 38, Max: 42 Tip Specifications Feature
Value Tip Height (µm)
12.5 Front Angle (º)
17.5 Back Angle (º)
25.0 Side Angle (º)
20.0 Coating
Au (Gold) on tip side Cantilever Specifications Feature
Value Material
Antimony (n) doped Si (0.010–0.025 Ohm·cm) Thickness (µm)
3.4 Coating
Au (Gold) 50 nm on reflex side Number of Cantilevers
1
