Description
DESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8″) pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9). Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs The large and extremely versatile vise clamp is intended for large and heady samples or awkwardly shaped samples. Will clamp samples between 0-90mm. The two bases move 0-25mm. The array of holes take precision stainless steel 1/16″ pins (10 pins are included) for either clamping the sample or for positioning the vise clamps (included). Each base has 9 positions for the vise clamp to enable optimum holding of samples up to 90mm. Overall size is 40W x 90L x 25mmH (1.6″ x 3.5″ x 1″). Standard 3.2mm (1/8″) pin with 9.5mm (3/8″) length. Screw used is 2-56 x 1/8, Set Cup, SS 15475 – PELCO® Large Universal Vise Clamp, Pin 15475-10 – Replacement Vise Clamps for Large Universal Vise 15475-20 – Replacement Pins for Large Universal Vise, 3/4″ long
