Description
Value Line Silicon Nitride probe for contact mode imaging and force measurements on soft samples. 10-Pack DESCRIPTION
TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Value Line Silicon Nitride probe for contact mode imaging and force measurements on soft samples. 6 silicon nitride cantilevers provide spring constants down to 0.01 N/m. • 0.01 to 0.6 N/m, 20nm tip radius, gold reflex coating • 10 probes per pack • Compatible with most commercial AFMs Geometry: A Triangle Tip Radius (nm): Nom: 20 Max: 70 Frequency (KHz): Nom: 22 Min: 12 Max: 32 Length (µm): Nom: 175 Min: 170 Max: 180 Spring Const (N/m): Nom: 0.07 Min: 0.02 Max: 0.15 Width (µm): Nom: 22 Min: 17 Max: 27 Tip Height:
2.5 – 8 µm Front Angle:
15 ± 2.5º Back Angle:
25 ± 2.5º Side Angle:
17.5 ± 2.5º Cantilever Material:
Silicon Nitride Geometry:
Rectangular & Triangular Cantilever Thickness (Nom):
0.55µm Cantilever Thickness (RNG):
0.5 – 0.6µm Cantilevers Number:
6 Back Side Coating:
Reflective Gold
