Description
Super Sharp Conductive Single Crystal Diamond Probes, 2.8 N/m, 65 kHz, <5 nm ROC, 5-Pack DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS Super Sharp Conductive Single Crystal Diamond Probes, 2.8 N/m, 65 kHz, <5 nm ROC, 5-Pack Super sharp tip for highest resolution combined with intermediate spring constant for applications including: – Topography imaging in PeakForce Tapping, Tappingmode, and contact mode. – Electrical characterization with PeakForce TUNA, TUNA, CAFM. – Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation. Highly conductive Apex Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. These tips are sharper and last longer than any other electrical AFM probe. The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 – 0.005 Ohm·cm. Contact resistance is typically 10 k? depending on contact radius measured on a silver surface. By using wear-resistant sharp diamond probes the contact size is well characterized and stays constant during mechanical measurements. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam. Tip Geometry:
Standard Tip Height:
12.5 ± 2.5 Front Angle:
25 ± 5 Back Angle:
15 ± 5 Side Angle:
22.5 ± 5 Tip Radius (Nom):
<5 Tip Coating:
Highly conductive single crystal diamond Tip Set Back( RNG):
15 – 25 Tilt Compensation:
0 ± 1 Cantilever Thickness (Nom):
1.5 Cantilever Thickness (RNG):
1.0 – 2.0 Cantilever Geometry:
Rectangular Cantilevers Number:
1 Back Side Coating:
Reflective Au
