Description
DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS High aspect ratio probe for small scale structures. This model offers 100nm tall cylindrical shaped pillar tips with 20nm base diameter, combined with an intermediate 2.8N/m spring constant. As with all Adama probes, these are formed out of single crystal boron doped diamond and are wear resistant and conductive. Suitable for electrical characterization with PeakForce TUNA, TUNA, and CAFM.
L225um, W35um, K2.8N/m, F65kHz,R<20nm, 100nm tall Tip Geometry:
Standard Tip Height:
12.5 +/- 2.5 um Front Angle:
25+/-5deg Back Angle:
15+/-5deg Side Angle:
22.5+/-5deg Tip Radius (Nom):
20nm Tip Coating:
Highly conductive single cystal diamond Tilt Compensation:
4 +/- 1deg Cantilever Material:
Diamond pillar, 20nm-w, med-k, 5pk Cantilever Thickness (Nom):
1.5um Cantilever Thickness (RNG):
1-2um Cantilever Geometry:
Rectangular Cantilevers Number:
1 Back Side Coating:
Reflective Au
